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Combined Focused Ion Beam-Scanning Electron Microscopes

Combined Focused Ion Beam-Scanning Electron Microscopes

Microscope systems combining focused ion beam (FIB) and scanning electron microscope (SEM) capabilities; models with transmission electron microscope (TEM) capabilities available.

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1

PROTEINTECH GROUP INC 150 UL MAB HELIOS
SDP

50-307-8196 150 UL MAB HELIOS

ENCOMPASS_PREFERRED
2

Beckman Coulter Anti-Helios-Pacific Blue 50t

Anti-Helios-Pacific Blue 50t

ENCOMPASS