Promotional price valid on web orders only. Your contract pricing may differ. Interested in signing up for a dedicated account number?
Learn More

Terra Universal Cleanroom Probe Tips
SDP

Electropolished tips reduce contact resistance

Supplier:  Terra Universal 911102

Catalog No. 19-111-116


Explore all special offers
Add to Cart

Description

Description

Tip minimizes breakage and can be used for all automatic and manual wafer probing units.

  • Taper length: 6mm (0.23 in.)
  • Taper angle: 5°
  • Tip radius: 0.0127mm (0.0005 in.)
  • Shank diameter: 0.51mm (0.02 in.)

Specifications

Specifications

Automatic and Manual Wafer Probing Units
0.23 in.
Tungsten
Probe Tip
0.58 cm
Product Suggestions

Product Suggestions

Videos
SDS
Documents

Documents

Product Certifications
Promotions

Promotions

Product Content Correction

Your input is important to us. Please complete this form to provide feedback related to the content on this product.

Product Title

By clicking Submit, you acknowledge that you may be contacted by Fisher Scientific in regards to the feedback you have provided in this form. We will not share your information for any other purposes. All contact information provided shall also be maintained in accordance with our Privacy Policy.

Your feedback has been submitted: Thank you for helping us improve our website.